(Test Result)
(Test Result)| Square | Circle | |
|---|---|---|
| Minimum wall | 30 * 30㎛ | 30㎛ |
| Minimum hole size | 7㎛ | 5㎛ |
| Material | Si3N4, Machinable Ceramic | S-1000, MDS-100 |
Vertical Probe Card Device
WAFER LEVEL TEST SOCKET
WLCSP stands for Wafer-Level Chip-Scale Package, a type of integrated |cir cuit package designed to be mounted dir ectly on a printed circuit board |(PCB) without a board.
주요사항
LOGIC TEST SOCKET
|
Spring Force |
Initial Force
Recommended Stroke
Full Stroke
|
2.5gf
0.70mm @ 15.5gf
0.90mm @ 19.0gf
|
|
Material Spec |
Barrel
Top Plunger
Bottom Plunger
Spring
|
PBT / Gold plated
SK4 / Gold plated
Becu / Gold plated
SWP / Gold plated
|
|
Mechanical Spec |
Pointing Accuracy
Operating Temperature
Spring Life Expectancy
|
± 50um
-25°C ~ +125°C
200K <
|
|
Electrical Spec |
DC Resistance (Avg)
Current Rating
Band Width
Self Inductance
Capacitance
|
<80mΩ
2 amps continuous
-1 dB @ 18.11 GHz
0.93nH
0.52pF
|
* 항목이 많으면 좌우 스크롤이 가능합니다.
WAFER LEVEL TEST SOCKET
WLCSP stands for Wafer-Level Chip-Scale Package, a type of integrated |cir cuit package designed to be mounted dir ectly on a printed circuit board |(PCB) without a board.
주요사항